High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures /
The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structur...
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer New York,
2004.
|
| Edition: | Second edition. |
| Series: | Advanced texts in physics.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Search Result 1