High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures /

The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structur...

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Bibliographic Details

Main Author:	Pietsch, Ulrich
Corporate Author:	SpringerLink (Online service)
Other Authors:	Holý, Václav, Baumbach, Tilo
Format:	eBook
Language:	English
Published:	New York, NY : Springer New York, 2004.
Edition:	Second edition.
Series:	Advanced texts in physics.
Subjects:	Optical materials. Nanotechnology. Surfaces (Physics) Electronic books.
Online Access:	Connect to the full text of this electronic book