Optical Characterization of Epitaxial Semiconductor Layers /

The last decade has witnessed an explosive development in the growth of expitaxial layers and structures with atomic-scale dimensions. This progress has created new demands for the characterization of those stuctures. Various methods have been refined and new ones developed with the main emphasis on...

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Bibliographic Details

Main Author:	Bauer, Günther
Corporate Author:	SpringerLink (Online service)
Other Authors:	Richter, Wolfgang
Format:	eBook
Language:	English
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg, 1996.
Subjects:	Optical materials. Surfaces (Physics) Electronic books.
Online Access:	Connect to the full text of this electronic book