Yield and Variability Optimization of Integrated Circuits /
Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circ...
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | |
| Format: | eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
1995.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Search Result 1
