Yield and Variability Optimization of Integrated Circuits /

Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circ...

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Bibliographic Details

Main Author:	Zhang, J. C.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Styblinski, M. A.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1995.
Subjects:	Engineering. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book