Altet, J., & Rubio, A. (2002). Thermal Testing of Integrated Circuits. Springer US.
Chicago Style (17th ed.) CitationAltet, Josep, and Antonio Rubio. Thermal Testing of Integrated Circuits. Boston, MA: Springer US, 2002.
MLA (9th ed.) CitationAltet, Josep, and Antonio Rubio. Thermal Testing of Integrated Circuits. Springer US, 2002.
Warning: These citations may not always be 100% accurate.