Thermal Testing of Integrated Circuits /

Thermal Testing of Integrated Circuits presents the feasibility to consider temperature as an observable for testing purposes. The coupling of circuits through heat is inherent to the solid-state nature and the inspection of temperature does not interact with Under Test Circuits or Systems, somethin...

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Bibliographic Details

Main Author:	Altet, Josep
Corporate Author:	SpringerLink (Online service)
Other Authors:	Rubio, Antonio
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 2002.
Subjects:	Engineering. Machinery. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book