Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics /

This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems such as cross-talk, electromigration, self-heat, etc. become important. Cross-talk is one of the major problems since it r...

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Bibliographic Details

Main Author:	Khatri, Sunil P.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Brayton, Robert K., Sangiovanni-Vincentelli, Alberto L.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 2001.
Subjects:	Engineering. Computer-aided design. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book