Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions /

This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic...

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Bibliographic Details

Main Author:	Spaeth, Johann-Martin
Corporate Author:	SpringerLink (Online service)
Other Authors:	Overhof, Harald
Format:	eBook
Language:	English
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg, 2003.
Series:	Springer series in materials science ; 51.
Subjects:	Optical materials. Electronic books.
Online Access:	Connect to the full text of this electronic book