IDDQ Testing of VLSI Circuits /

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply f...

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Bibliographic Details

Main Author:	Gulati, Ravi K.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Hawkins, Charles F.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1993.
Subjects:	Computer science. Computer-aided design. Computer engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book