Delay Fault Testing for VLSI Circuits /
With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices....
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | |
| Format: | eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
1998.
|
| Series: | Frontiers in electronic testing ;
14. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Search Result 1
