Delay Fault Testing for VLSI Circuits /

With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices....

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Bibliographic Details

Main Author:	Krstić, Angela
Corporate Author:	SpringerLink (Online service)
Other Authors:	Cheng, Kwang-Ting
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1998.
Series:	Frontiers in electronic testing ; 14.
Subjects:	Engineering. Computer-aided design. Computer engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book