APA (7th ed.) Citation

Krstić, A., & Cheng, K. (1998). Delay Fault Testing for VLSI Circuits. Springer US.

Chicago Style (17th ed.) Citation

Krstić, Angela, and Kwang-Ting Cheng. Delay Fault Testing for VLSI Circuits. Boston, MA: Springer US, 1998.

MLA (9th ed.) Citation

Krstić, Angela, and Kwang-Ting Cheng. Delay Fault Testing for VLSI Circuits. Springer US, 1998.