Lock-in Thermography : Basics and Use for Functional Diagnostics of Electronic Components /

The book deals with lock-in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady-state thermography, the lock-in mode enables a much improved signal/noise ratio (up to 1000x) by signal averaging, a far...

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Bibliographic Details

Main Author:	Breitenstein, O. (Otwin)
Corporate Author:	SpringerLink (Online service)
Other Authors:	Langenkamp, Martin
Format:	eBook
Language:	English
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg, 2003.
Series:	Springer series in advanced microelectronics ; 10.
Subjects:	Engineering. Electronics. Optical materials. Nanotechnology. Electronic books.
Online Access:	Connect to the full text of this electronic book