Microelectronics Manufacturing Diagnostics Handbook /

This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.

Bibliographic Details
Main Author: Landzberg, Abraham H.
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA : Springer US, 1993.
Subjects:
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Call Number: TJ241
 
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TJ241 Available