From Contamination to Defects, Faults and Yield Loss : Simulation and Applications /

Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substa...

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Bibliographic Details

Main Author:	Khare, Jitendra B.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Maly, W.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1996.
Series:	Frontiers in electronic testing ; 5.
Subjects:	Engineering. Computer-aided design. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book