Characterization Methods for Submicron MOSFETs /

The Metal-Oxide Semiconductor Field-Effect Transistor (MOSFET) is a key component in modern microelectronics. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements making the task of MOSFET characterization increasingly crucial, as well a...

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Bibliographic Details

Main Author:	Haddara, Hisham
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1996.
Series:	Kluwer international series in engineering and computer science. Analog circuits and signal processing ; 352.
Subjects:	Engineering. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book