Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits /

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book the...

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Bibliographic Details

Main Author:	Roberts, Gordon W.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Lu, Albert K.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1995.
Series:	Springer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing ; 312.
Subjects:	Engineering. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book