Modeling of Electrical Overstress in Integrated Circuits /

Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents...

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Bibliographic Details

Main Author:	Díaz, Carlos H.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Kang, Sung-Mo, Duvvury, Charvaka
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1995.
Series:	International series in engineering and computer science ; 289.
Subjects:	Engineering. Computer engineering. Systems engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book