Defect oriented testing for CMOS analog and digital circuits /

Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of qua...

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Bibliographic Details

Main Author:	Sachdev, Manoj
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Boston : Kluwer Academic, [1998]
Series:	Frontiers in electronic testing.
Subjects:	Metal oxide semiconductors, Complementary > Testing. Metal oxide semiconductors, Complementary > Defects. Linear integrated circuits > Testing. Digital integrated circuits > Testing. CMOS-Schaltung. Testen. Electronic books.
Online Access:	Connect to the full text of this electronic book