Quantitative X-Ray Diffractometry /

One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the st...

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Bibliographic Details

Main Author:	Zevin, Lev S.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Kimmel, Giora, Mureinik, Inez
Format:	eBook
Language:	English
Published:	New York, NY : Springer US, 1995.
Subjects:	Physics. Crystallography. Electronic books.
Online Access:	Connect to the full text of this electronic book