Failure Analysis of Integrated Circuits : Tools and Techniques /

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specif...

Full description

Bibliographic Details
Main Author: Wagner, Lawrence C.
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA : Springer US, 1999.
Series:International series in engineering and computer science ; 494.
Subjects:
Online Access:Connect to the full text of this electronic book
Search Result 1
Published 1999
Book