Failure Analysis of Integrated Circuits : Tools and Techniques /

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specif...

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Bibliographic Details

Main Author:	Wagner, Lawrence C.
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1999.
Series:	International series in engineering and computer science ; 494.
Subjects:	Computer engineering. Optical materials. Electronic books.
Online Access:	Connect to the full text of this electronic book