Atomic force microscopy/scanning tunneling microscopy 2 /

Bibliographic Details
Corporate Authors:	SpringerLink (Online service), U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors:	Cohen, Samuel H., Lightbody, Marcia L.
Format:	Conference Proceeding eBook
Language:	English
Published:	New York : Springer Science+Business Media, [1997]
Subjects:	Atomic force microscopy > Congresses. Scanning tunneling microscopy > Congresses. Materials Science. Characterization and Evaluation of Materials. Biological Microscopy. Analytical Chemistry. Atomic/Molecular Structure and Spectra. Atomic force microscopy. Scanning tunneling microscopy. Kongre€. Kraftmikroskopie. Rastertunnelmikroskopie. Electronic books. Natick (Mass., 1994)
Online Access:	Connect to the full text of this electronic book

Table of Contents:

Scanned probe microscopy / Michael F. Crommie
Scanning tunneling microscopy for Very Large-Scale Integration (VLSI) Inspection / Shane Y. Hong
Scanning tunneling microscopy-based fabrication of nanometer scale structures / Munir H. Nayfeh
A microscopy for our time / Elinor Solit
Scanning tunneling microscopy of chemical vapor deposition diamond film growth on highly oriented pyrolytic graphite and silicon / A.F. Aviles [and others]
Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films / T.W. Mercer [and others].