Atomic force microscopy/scanning tunneling microscopy 2 /

Bibliographic Details
Corporate Authors:	SpringerLink (Online service), U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors:	Cohen, Samuel H., Lightbody, Marcia L.
Format:	Conference Proceeding eBook
Language:	English
Published:	New York : Springer Science+Business Media, [1997]
Subjects:	Atomic force microscopy > Congresses. Scanning tunneling microscopy > Congresses. Materials Science. Characterization and Evaluation of Materials. Biological Microscopy. Analytical Chemistry. Atomic/Molecular Structure and Spectra. Atomic force microscopy. Scanning tunneling microscopy. Kongre€. Kraftmikroskopie. Rastertunnelmikroskopie. Electronic books. Natick (Mass., 1994)
Online Access:	Connect to the full text of this electronic book

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