Atomic force microscopy/scanning tunneling microscopy 2 /
| Corporate Authors: | SpringerLink (Online service), U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium |
|---|---|
| Other Authors: | Cohen, Samuel H., Lightbody, Marcia L. |
| Format: | Conference Proceeding eBook |
| Language: | English |
| Published: |
New York :
Springer Science+Business Media,
[1997]
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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