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Atomic force microscopy/scanning tunneling microscopy 2 /

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Bibliographic Details
Corporate Authors: SpringerLink (Online service), U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors: Cohen, Samuel H., Lightbody, Marcia L.
Format: Conference Proceeding eBook
Language:English
Published: New York : Springer Science+Business Media, [1997]
Subjects:
Atomic force microscopy > Congresses.
Scanning tunneling microscopy > Congresses.
Materials Science.
Characterization and Evaluation of Materials.
Biological Microscopy.
Analytical Chemistry.
Atomic/Molecular Structure and Spectra.
Atomic force microscopy.
Scanning tunneling microscopy.
Kongre€.
Kraftmikroskopie.
Rastertunnelmikroskopie.
Electronic books.
Natick (Mass., 1994)
Online Access:Connect to the full text of this electronic book
Description
Item Description:"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--Title page verso.
Electronic resource.
Physical Description:1 online resource (ix, 250 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:9781475793253 (electronic bk.)
1475793251 (electronic bk.)