Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits /

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Compute...

Full description

Bibliographic Details

Main Author:	Michael, Christopher, Dr
Corporate Author:	SpringerLink (Online service)
Other Authors:	Ismail, Mohammed
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1993.
Series:	Kluwer international series in engineering and computer science. Analog circuits and signal processing ; 211.
Subjects:	Computer science. Computer-aided design. Computer engineering. Electronic books.
Online Access:	Connect to the full text of this electronic book