APA (7th ed.) Citation

Howie, A., & Valdrè, U. (1989). Surface and Interface Characterization by Electron Optical Methods. Springer US.

Chicago Style (17th ed.) Citation

Howie, A., and U. Valdrè. Surface and Interface Characterization by Electron Optical Methods. Boston, MA: Springer US, 1989.

MLA (9th ed.) Citation

Howie, A., and U. Valdrè. Surface and Interface Characterization by Electron Optical Methods. Springer US, 1989.