Surface and Interface Characterization by Electron Optical Methods /

Bibliographic Details
Main Author: Howie, A.
Corporate Author: SpringerLink (Online service)
Other Authors: Valdrè, U.
Format: eBook
Language:English
Published: Boston, MA : Springer US, 1989.
Series:NATO ASI series. Physics ; 16.
Subjects:
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Call Number: QC176-176.9
 
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