APA (7th ed.) Citation

Hamdioui, S. (2004). Testing static random access memories: Defects, fault models, and test patterns. Kluwer Academic.

Chicago Style (17th ed.) Citation

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models, and Test Patterns. Boston: Kluwer Academic, 2004.

MLA (9th ed.) Citation

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models, and Test Patterns. Kluwer Academic, 2004.