Testing static random access memories : defects, fault models, and test patterns /

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers...

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Bibliographic Details

Main Author:	Hamdioui, Said
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Boston : Kluwer Academic, 2004.
Series:	Frontiers in electronic testing.
Subjects:	Random access memory > Testing. Electronic books.
Online Access:	Connect to the full text of this electronic book