High Resolution Focused Ion Beams: FIB and its Applications : the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology /
In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly si...
| Main Author: | Orloff, Jon |
|---|---|
| Corporate Author: | SpringerLink (Online service) |
| Other Authors: | Utlaut, Mark, Swanson, Lynwood |
| Format: | eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US : Imprint : Springer,
2003.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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