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Integrated circuit defect-sensitivity : theory and computational models /

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Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Defect-Sensitivity: Theory and Computational Models r...

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Bibliographic Details
Main Author: Pineda de Gyvez, José
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston : Kluwer Academic Publishers, [1993]
Series:Kluwer international series in engineering and computer science ; SECS 208.
Kluwer international series in engineering and computer science. Microelectronics manufacturing.
Subjects:
Integrated circuits > Very large scale integration > Computer-aided design.
Integrated circuits > Very large scale integration > Defects > Mathematical models.
Circuits intégrés à très grande échelle.
Fehlererkennung.
Integrierte Schaltung.
Electronic books.
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Call Number: TK7874 .P53 1993eb
 
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TK7874 .P53 1993eb Available