Simultaneous switching noise of CMOS devices and systems /

Simultaneous Switching Noise (SSN) of CMOS Devices and Systems covers recent research on package-induced noise problems in single and multi-chip package assemblies. It examines in detail the methods for calculating SSN and overall noise containment in a system. In addition, the authors discuss SSN m...

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Bibliographic Details

Main Author:	Senthinathan, Ramesh, 1961-
Corporate Author:	SpringerLink (Online service)
Other Authors:	Prince, John L., 1941-
Format:	eBook
Language:	English
Published:	Boston : Kluwer Academic, [1994]
Series:	Kluwer international series in engineering and computer science. Electronic packaging and interconnects.
Subjects:	Metal oxide semiconductors > Design and construction. Electronic circuits > Noise. Circuitos eletrônicos. Dispositivos semicondutores. CMOS-Schaltung. Rauschen. Electronic books.
Online Access:	Connect to the full text of this electronic book