Scanning Electron Microscopy and X-ray Microanalysis /
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspe...
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| Other Authors: | , , , , , , |
| Format: | eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2003.
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| Edition: | Third edition. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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