Scanning Electron Microscopy and X-ray Microanalysis /
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspe...
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Bibliographic Details
| Main Author: |
Goldstein, Joseph I. |
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| Corporate Author: |
SpringerLink (Online service) |
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| Other Authors: |
Newbury, Dale E.,
Echlin, Patrick,
Joy, David C., 1943-,
Lyman, Charles E.,
Lifshin, Eric,
Sawyer, Linda,
Michael, Joseph R. |
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| Format: | eBook
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| Language: | English |
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| Published: |
Boston, MA :
Springer US,
2003.
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| Edition: | Third edition. |
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| Subjects: | |
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| Online Access: | Connect to the full text of this electronic book
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