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Scanning Electron Microscopy and X-ray Microanalysis /

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This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspe...

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Bibliographic Details
Main Author:	Goldstein, Joseph I.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Newbury, Dale E., Echlin, Patrick, Joy, David C., 1943-, Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 2003.
Edition:	Third edition.
Subjects:	Microscopy. Nanotechnology. Surfaces (Physics) Electronic books.
Online Access:	Connect to the full text of this electronic book

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