Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Lyman, C. E., Lifshin, E., . . . Michael, J. R. (2003). Scanning Electron Microscopy and X-ray Microanalysis (Third edition.). Springer US.
Chicago Style (17th ed.) CitationGoldstein, Joseph I., Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, and Joseph R. Michael. Scanning Electron Microscopy and X-ray Microanalysis. Third edition. Boston, MA: Springer US, 2003.
MLA (9th ed.) CitationGoldstein, Joseph I., et al. Scanning Electron Microscopy and X-ray Microanalysis. Third edition. Springer US, 2003.
Warning: These citations may not always be 100% accurate.