Noncontact Atomic Force Microscopy /
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resoluti...
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint : Springer,
2002.
|
| Series: | Nanoscience and technology.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Search Result 1
