Noncontact Atomic Force Microscopy /

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resoluti...

Full description

Bibliographic Details

Main Author:	Morita, S.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Wiesendanger, R., Meyer, E.
Format:	eBook
Language:	English
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint : Springer, 2002.
Series:	Nanoscience and technology.
Subjects:	Nanotechnology. Surfaces (Physics) Electronic books.
Online Access:	Connect to the full text of this electronic book