Noncontact Atomic Force Microscopy /
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resoluti...
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| Format: | eBook |
| Language: | English |
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Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint : Springer,
2002.
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| Series: | Nanoscience and technology.
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| Online Access: | Connect to the full text of this electronic book |
| Summary: | Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues. |
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| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (XVIII, 439 pages 243 illustrations, 5 illustrations in color.) |
| ISBN: | 9783642560194 (electronic bk.) 3642560199 (electronic bk.) |