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Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /

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Reliability, Yield, and Stress Burn-In explains reliability issues in Microelectronics Systems Manufacturing and Software Development with an emphasis on evolving manufacturing technology for the semiconductor industry. Since most microelectronics components have their infant mortality period for ab...

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Bibliographic Details
Main Author: Kuo, Way, 1951-
Corporate Author: SpringerLink (Online service)
Other Authors: Chien, Wei-Ting Kary, 1965-, Kim, Taeho, 1960-
Format: eBook
Language:English
Published: Boston, Mass : Kluwer Academic Publishers, [1998]
Subjects:
Integrated circuits > Design and construction > Reliability.
Microelectronics > Reliability.
Computer software > Development > Reliability.
Semiconductors > Computer programs > Reliability.
Semiconducteurs > Logiciels > Fiabilité.
Circuits intégrés > Développement > Fiabilité.
Microélectronique > Fiabilité.
Logiciels > Développement > Fiabilité.
Elektronisches Bauelement.
Zuverlässigkeit.
Electronic books.
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Call Number: TK7874 .K867 1998eb
 
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TK7874 .K867 1998eb Available