Scanning electron microscopy : physics of image formation and microanalysis /

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling...

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Bibliographic Details

Main Author:	Reimer, Ludwig, 1928-
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [1998]
Edition:	Second completely revised and updated edition.
Series:	Springer series in optical sciences ; v. 45.
Subjects:	Scanning electron microscopy. Elektronenmicroscopie. Verstrooiing. Kristalstructuur. Rasterelektronenmikroskopie. Optique électronique. Instruments d'optique. Electronic books.
Online Access:	Connect to the full text of this electronic book