Transmission electron microscopy and diffractometry of materials /
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif-...
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| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
2001.
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| Online Access: | Connect to the full text of this electronic book |
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