Transmission electron microscopy and diffractometry of materials /

This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif-...

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Bibliographic Details

Main Author:	Fultz, B. (Brent)
Corporate Author:	SpringerLink (Online service)
Other Authors:	Howe, James M., 1955-
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, 2001.
Subjects:	Materials > Microscopy. Transmission electron microscopy. X-ray diffractometer. Matériaux > Microscopie. Microscopie électronique à transmission. Diffractomètres à rayons X. Rayons X > Diffraction. Microscopie électronique en transmission. Electronic books.
Online Access:	Connect to the full text of this electronic book