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Defect and fault tolerance in VLSI systems : volume 2 : proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 22-24, 1989, in Tampa, Florida /

Bibliographic Details
Corporate Authors: International Workshop on Defect and Fault Tolerance in VLSI Systems Tampa, Florida, SpringerLink (Online service)
Other Authors: Stapper, C. H. (Editor), Jain, V. K. (Editor), Saucier, Gabrièle (Editor)
Format: Conference Proceeding eBook
Language:English
Published: New York : Springer Science+Business Media, [1990]
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Fault-tolerant computing > Congresses.
Fault-tolerant computing.
Integrated circuits > Very large scale integration > Design and construction.
Electronic books.
Conference proceedings.
Online Access:Connect to the full text of this electronic book
Description
Physical Description:1 online resource (xiii, 316 pages) : illustrations
ISBN:9781475799576
1475799578