Defect and fault tolerance in VLSI systems : volume 2 : proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 22-24, 1989, in Tampa, Florida /

Bibliographic Details
Corporate Authors:	International Workshop on Defect and Fault Tolerance in VLSI Systems Tampa, Florida, SpringerLink (Online service)
Other Authors:	Stapper, C. H. (Editor), Jain, V. K. (Editor), Saucier, Gabrièle (Editor)
Format:	Conference Proceeding eBook
Language:	English
Published:	New York : Springer Science+Business Media, [1990]
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses. Fault-tolerant computing > Congresses. Fault-tolerant computing. Integrated circuits > Very large scale integration > Design and construction. Electronic books. Conference proceedings.
Online Access:	Connect to the full text of this electronic book

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