Atom probe tomography : analysis at the atomic level /

Written by the inventor of the technique, this book provides the first complete description of atom probe tomography (APT). This microanalytical technique enables the distribution of all the elements present in a material to be experimentally determined. The instrument known as a three-dimensional a...

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Bibliographic Details

Main Author:	Miller, M. K. (Michael Kenneth) (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	New York : Springer, [2000]
Subjects:	Atom-probe field ion microscopy. Tomography. Electronic books.
Online Access:	Connect to the full text of this electronic book