Transmission electron microscopy and diffractometry of materials /
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of d...
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| Format: | eBook |
| Language: | English |
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Berlin ; New York :
Springer,
[2002]
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| Edition: | Second edition. |
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| Online Access: | Connect to the full text of this electronic book |
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